Description

Product release: TeraLyzer pro

TeraLyzer pro: A Menlo Systems software solution for thickness and material parameter measurement

Versatility and real-time measurements: This easy-to-use software combines the fast and non-contact nature of terahertz reflection measurements to accurately extract the thickness and complex dielectric parameters (d, n, α, κ, ε', ε'') of mono-/multi-layered samples in real time. This enables numerous applications, e.g., paint thickness monitoring (automotives and art industries), non-destructive coating uniformity inspection (pharma and polymer industries), semiconductor testing, and testing of thin films in real-time.

Accuracy: The software adopts a Monte-Carlo optimization method based on a reference THz time-trace to accurately resolve the underlying material properties and layer thickness, all the way from a sub-wavelength regime (10 µm) to tens of centimeters (cm).

User-friendly interface, data visualization and analysis: TeraLyzer pro comes with a user-friendly graphical user interface (GUI) that is designed to be graphically intuitive and offers a step-by-step guide to the user.

Compatibility: As part of the Menlo Systems software suite, it interfaces seamlessly with ScanControl to provide the best user experience possible. It works on Windows 10 and later versions and is compatible with current and older generation Menlo Systems THz spectrometers.

 

 Reflection Head

 

The perfect hardware fit to our new software TeraLyzer pro!

With our new Reflection Head, you can mount your fiber-coupled THz antenna modules in a compact, alignment-free device to focus on your reflection measurements with no compromise in performance (> 6THz).

The lightweight measurement head is a perfect fit to robotic arms and other actuators for in-line reflection measurements and THz thickness measurements: the compatibility with Menlo Systems’ TERA15-FC fiber coupled antenna modules ensures the highest flexibility.

Bonus feature: acquire water-absorption-free THz spectra, without enclosing your sample! The integrated purging inlet enables a fast purging of the compact volume of the reflection head while scanning.

 

THz performance conform to a recognized standard: VDI/VDE 5590 guideline

A few years ago, members of the terahertz community in Germany, including Menlo Systems, initiated the formation of VDI standards for terahertz systems. Since terahertz systems are employed in various fields and throughout diversified communities, the initiative serves, among other aspects, to develop a consistent language and to map quality characteristics for THz technology. Namely, these norms ensure that system performance is tested in a consistent and transparent fashion across the industry.

We are now proud to announce the availability of a VDI/VDE 5590 guideline for the evaluation of the performance of THz systems, which we employ in our standard testing and specification procedure.

Learn more here about the committed and the VDI/VDE 5590 standard:

https://www.linkedin.com/posts/menlo-systems_terahertz-thz-teratec2022-activity-6937737139577094144-wlDd?utm_source=share&utm_medium=member_desktop

Terahertz Mirror Optics for flexible reflection and transmission measurements

Menlo Systems introduces new, flexible parabolic mirrors terahertz optics for easy transition between reflection and transmission measurements. Sweep the reflection angle continuously and in a controlled fashion while measuring with the highest bandwidth of the THz-TDS system: 6 THz. Available with our TERA K15 and TeraSmart! This unit is available as an option for all Menlo THz-TDS models and is compatible to most existing Menlo Systems terahertz systems. Request your retrofit!